{"id":375,"date":"2018-08-22T14:19:43","date_gmt":"2018-08-22T05:19:43","guid":{"rendered":"http:\/\/www-wp22.ile.osaka-u.ac.jp\/?page_id=375"},"modified":"2019-01-10T09:41:54","modified_gmt":"2019-01-10T00:41:54","slug":"terahertz-measurement","status":"publish","type":"page","link":"http:\/\/www-wp22.ile.osaka-u.ac.jp\/eng\/facilities\/terahertz-measurement\/","title":{"rendered":"Terahertz (THz) wave measurement system"},"content":{"rendered":"
THz time-domain spectroscopy (THz-TDS) and laser THz emission spectroscopy on various materials (semiconductors, dielectric materials, oxides, organic materials, etc.) are possible in the temperature down to about 10 K.<\/p>\n
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Overview of THz wave measurement system<\/p>\n
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THz-TDS data of extremely thin Graphen sample using parallel plate waveguide (PPWG).
\nFor reference, normal THz-TDS data is also shown.<\/p>\n
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In addition to the above measurements, laser terahertz emission microscopy (LTEM), time-resolved pump-probe THz imaging & spectroscopy, and broadband (~7 THz) THz-TDS measurement, etc. can also be performed.
\nPlease contact us for details.<\/p>\n
If you apply for collaborative research using this system, please contact the person in charge in advance.<\/p>\n